IEEE - Institute of Electrical and Electronics Engineers, Inc. - Broadband time-domain measurement system applied to the characterization of cross-modulation in nonlinear microwave devices

2009 IEEE MTT-S International Microwave Symposium Digest (MTT)

Author(s): Abouchahine, M. ; Saleh, A. ; Neveux, G. ; Reveyrand, T. ; Teyssier, J.P. ; Barataud, D. ; Nebus, J.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Boston, MA, USA, USA
Conference Date: 7 June 2009
Page(s): 1,201 - 1,204
ISBN (CD): 978-1-4244-2804-5
ISBN (Paper): 978-1-4244-2803-8
ISSN (Paper): 0149-645X
DOI: 10.1109/MWSYM.2009.5165918
Regular:

This paper presents a calibrated 4 channel broadband time-domain measurement system for the characterization of nonlinear microwave devices. The hardware architecture of the proposed measurement... View More

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