IEEE - Institute of Electrical and Electronics Engineers, Inc. - Theoretical and practical realization for the uncertainty measurement by coverage interval

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Wen-Hui Lo ; Sin-Horng Chen
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 1,562 - 1,567
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168704
Regular:

Uncertainty measurement and expression can be considered in different ways, but by using coverage interval is the most popular method if considering the bounding information. In this paper, we... View More

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