IEEE - Institute of Electrical and Electronics Engineers, Inc. - Profile measurement via circle-line spline fitting

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Matthew Harker ; Paul O'Leary ; Richard Neumayr
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 1,531 - 1,536
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168698
Regular:

For quality control purposes, it is necessary to measure an object's dimensions, and compare them with a CAD model; this is effectively a reverse engineering task. The specific example addressed... View More

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