IEEE - Institute of Electrical and Electronics Engineers, Inc. - Combining ATE and flying probe in-circuit test strategies for load board verification and test

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Soh Ying Seah ; Melanie Po-Leen Ooi ; Ye Chow Kuang ; Chee Sun See ; Shanti Panchadcharam ; Serge Demidenko
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 1,380 - 1,385
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168671
Regular:

Load board verification is normally performed by IC manufacturers on an automatic test equipment (ATE) as per of the standard test procedure prior to final test. Since test load boards are used as... View More

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