IEEE - Institute of Electrical and Electronics Engineers, Inc. - Harmonization of standard procedures for ADC time domain dynamic testing

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): E Balestrieri ; P Daponte ; S Rapuano
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 1,238 - 1,243
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168644
Regular:

The paper deals with the ADC dynamic parameters and test methods in the time domain by means of sine wave fitting. An analytical comparison of these methods, according to the internationally... View More

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