IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multiplying delay locked loop (MDLL) in time-to-digital conversion

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Jussi-Pekka Jansson ; Antti Mantyniemi ; Juha Kostamovaara
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 1,226 - 1,231
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168642
Regular:

This paper presents the use of a multiplying delay locked loop (MDLL) for delay line-based time interval measurement. The structure is introduced together with the theory behind the performance.... View More

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