IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic stress-strength approach for reliability prediction

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Maria Gabriella Masi ; Lorenzo Peretto ; Roberto Tinarelli
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 1,171 - 1,176
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168632
Regular:

The role of reliability prediction during the design stage of a system is worldwide recognized. Simulation tools and proper experimental approaches are usually applied to get reliability... View More

Advertisement