IEEE - Institute of Electrical and Electronics Engineers, Inc. - Novel functional testing technique for asynchronous nanowire crossbar system

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Sriram Venkateswaran ; Jong-Seok Lee ; Minsu Choi
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 1,121 - 1,125
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168622
Regular:

The recently proposed asynchronous nanowire clock-free crossbar architecture is envisioned to enhance the manufacturability and to improve the robustness of digital circuits by removing various... View More

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