IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance evaluation of CNFET-based logic gates

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Geunho Cho ; Yong-Bin Kim ; Fabrizio Lombardi ; MinSu Choi
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 909 - 912
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168580
Regular:

As the physical gate length of current devices is reduced to below 65 nm, effects (such as large parametric variations and increase in leakage current) have caused the I-V characteristics to be... View More

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