IEEE - Institute of Electrical and Electronics Engineers, Inc. - An inverse scattering based hybrid method for the measurement of the complex dielectric permittivities of arbitrarily shaped homogenous targets

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Giovanni Bozza ; Massimo Brignone ; Matteo Pastorino ; Michele Piana ; Andrea Randazzo
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 719 - 723
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168544
Regular:

In this paper we present a hybrid approach for the measurement of the complex dielectric permittivities of arbitrarily shaped homogeneous dielectric scatterers by using microwaves. The proposed... View More

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