IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metrological characterization of algorithms adopted for voltage dip measurement

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Daniele Gallo ; Carmine Landi ; Mario Luiso
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 420 - 425
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168485
Regular:

This paper analyzes accuracy of algorithms commonly adopted in instrument devoted to the detection and the characterization of voltage dips (also called sags). This analysis is particularly... View More

Advertisement