IEEE - Institute of Electrical and Electronics Engineers, Inc. - An online defects inspection system for satin glass based on machine vision

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Francesco Adamo ; Filippo Attivissimo ; Attilio Di Nisio ; Mario Savino
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 288 - 293
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168461
Regular:

Today, quality control is a nodal point in many industries, and in the glass one in particular; in most cases the human control does not catch up with the pressing market requirements, therefore... View More

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