IEEE - Institute of Electrical and Electronics Engineers, Inc. - The stray capacitance on precision of high-voltage measurement

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Chunting Yang ; Mingwei Wu ; Caiwei Jian ; Jing Yu
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 249 - 253
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168453
Regular:

During the recent years, capacitor voltage transformers (CVT) gradually replace the electromagnetic voltage transformers (EVT) in high-voltage measurements. Because transient response of the CVT... View More

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