IEEE - Institute of Electrical and Electronics Engineers, Inc. - A test-bed designed to utilize Zhu's general sampling theorem to characterize power amplifiers

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Olav Andersen ; Niclas Bjorsell ; Niclas Keskitalo
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 201 - 204
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168443
Regular:

Characterizing power amplifiers require test set-ups with performance superior to the power amplifiers. A commonly used method is to use an IQ-demodulator. However, problem arises due to... View More

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