IEEE - Institute of Electrical and Electronics Engineers, Inc. - A tool for quality controls in industrial process

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Massimo Lazzaroni
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 68 - 73
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168418
Regular:

Statistical process control (SPC) is actually used in order to reduce non conformity (NC), defects and waste. Traditional approach to industrial process and quality control depends on the... View More

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