IEEE - Institute of Electrical and Electronics Engineers, Inc. - Object shape and reflectance property measurement using multiple illumination scanner

2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC)

Author(s): Hiroyuki Ukida ; Yoshio Tanimoto ; Tetsuya Sano ; Hideki Yamamoto
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Singapore, Singapore
Conference Date: 5 May 2009
Page(s): 24 - 29
ISBN (CD): 978-1-4244-3353-7
ISBN (Paper): 978-1-4244-3352-0
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2009.5168411
Regular:

In this study, we propose a method to estimate 3D shape, color and specular reflections of an object using an image scanner with multiple illuminations. In the first process, we estimate an... View More

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