IEEE - Institute of Electrical and Electronics Engineers, Inc. - An innovative timing slack monitor for variation tolerant circuits

2009 IEEE International Conference on IC Design and Technology (ICICDT)

Author(s): Rebaud, B. ; Belleville, M. ; Beigne, E. ; Robert, M. ; Maurine, P. ; Azemard, N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 18 May 2009
Page(s): 215 - 218
ISBN (Paper): 978-1-4244-2933-2
ISBN (Online): 978-1-4244-2934-9
DOI: 10.1109/ICICDT.2009.5166299
Regular:

To deal with variations, statistical methodologies can be completed by monitoring techniques implemented to cope with dynamic variations while keeping optimized operating points. This paper... View More

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