IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical-aware designs for the nm era

2009 IEEE International Conference on IC Design and Technology (ICICDT)

Author(s): Joshi, R. ; Kanj, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 18 May 2009
Page(s): 207 - 210
ISBN (Paper): 978-1-4244-2933-2
ISBN (Online): 978-1-4244-2934-9
DOI: 10.1109/ICICDT.2009.5166297
Regular:

As technology scaled beyond the 100nm node, process variation and particularly random variations effects have had significant impact on the design yield. Memory designs, namely SRAMs, have become... View More

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