IEEE - Institute of Electrical and Electronics Engineers, Inc. - SEE characterization and mitigation in ultra-deep submicron technologies

2009 IEEE International Conference on IC Design and Technology (ICICDT)

Author(s): Mavis, D.G. ; Eaton, P.H. ; Sibley, M.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 18 May 2009
Page(s): 105 - 112
ISBN (Paper): 978-1-4244-2933-2
ISBN (Online): 978-1-4244-2934-9
DOI: 10.1109/ICICDT.2009.5166276
Regular:

As technology feature sizes decrease, single event upset (SEU), digital single event transient (DSET), and multiple bit upset (MBU) effects dominate the radiation response of microcircuits in... View More

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