IEEE - Institute of Electrical and Electronics Engineers, Inc. - Timing yield estimation with clock network correlations by propagating discrete probability distributions

2009 IEEE International Conference on IC Design and Technology (ICICDT)

Author(s): Lee-eun Yu ; Changsik Shin ; Jing-Jia Liou ; Youngsoo Shin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 18 May 2009
Page(s): 63 - 66
ISBN (Paper): 978-1-4244-2933-2
ISBN (Online): 978-1-4244-2934-9
DOI: 10.1109/ICICDT.2009.5166266
Regular:

Timing yield, in conjunction with other types of yield, directly affects profit; under-estimation is as bad as over-estimation, because large amount of time is unnecessarily spent to increase... View More

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