IEEE - Institute of Electrical and Electronics Engineers, Inc. - ESD protection for RF/AMS ICs: Design and optimization

2009 IEEE International Conference on IC Design and Technology (ICICDT)

Author(s): Wang, X. ; Tang, H. ; Lin, L. ; Fang, Q. ; Zhao, H. ; Wang, A. ; Zhang, G. ; Wang, X. ; Zhou, Y. ; Lee Yang ; Chen, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Austin, TX, USA, USA
Conference Date: 18 May 2009
Page(s): 25 - 28
ISBN (Paper): 978-1-4244-2933-2
ISBN (Online): 978-1-4244-2934-9
DOI: 10.1109/ICICDT.2009.5166257
Regular:

This paper reviews key factors to practical ESD protection design for RF and analog/mixed-signal (AMS) ICs, including general challenges emerging, ESD-RFIC interactions, RF ESD design optimization... View More

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