IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement System of Diameters of Ultrafine Particles Based on Virtual Instrument

2009 International Joint Conference on Artificial Intelligence (JCAI)

Author(s): Zhenmei Li ; Wenge Li ; Boxue Tan ; Jin Shen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Hainan Island, China, China
Conference Date: 25 April 2009
Page(s): 602 - 605
ISBN (Paper): 978-0-7695-3615-6
DOI: 10.1109/JCAI.2009.51
Regular:

The measurement system of diameters of ultra fine particles was developed with virtual instrument. Instead of the much expensive correlator, the photon counting technology was applied: H6240-01,... View More

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