IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research Challenges and Solutions for the Knowledge Overload with Data Mining

2009 International Joint Conference on Artificial Intelligence (JCAI)

Author(s): Xingsen Li ; Lingling Zhang ; Zhengxiang Zhu ; Yong Shi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Hainan Island, China, China
Conference Date: 25 April 2009
Page(s): 237 - 240
ISBN (Paper): 978-0-7695-3615-6
DOI: 10.1109/JCAI.2009.137
Regular:

the rapid development of data technology, as exemplified by data mining and Internet growth, creates a large information overload and forthcoming knowledge overload. Data mining discovers a large... View More

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