IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spatial Clustering Algorithms and Quality Assessment

2009 International Joint Conference on Artificial Intelligence (JCAI)

Author(s): Jingke Xi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Hainan Island, China, China
Conference Date: 25 April 2009
Page(s): 105 - 108
ISBN (Paper): 978-0-7695-3615-6
DOI: 10.1109/JCAI.2009.162
Regular:

Spatial Data Mining (SDM) is the process of discovering interesting and previously unknown, but potentially useful patterns from large spatial databases. Being an important role of SDM, spatial... View More

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