IEEE - Institute of Electrical and Electronics Engineers, Inc. - Discussions on Knowledge Measurement and Value

2009 International Joint Conference on Artificial Intelligence (JCAI)

Author(s): Chen Xin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Hainan Island, China, China
Conference Date: 25 April 2009
Page(s): 53 - 55
ISBN (Paper): 978-0-7695-3615-6
DOI: 10.1109/JCAI.2009.204
Regular:

This paper is to discuss the exponential growth phase of the knowledge economy and the threats to exponential growth and how knowledge metrics will help, including the consumer and investor... View More

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