IEEE - Institute of Electrical and Electronics Engineers, Inc. - Wavelet usage for feature extraction for crack localization

2009 17th Mediterranean Conference on Control and Automation (MED)

Author(s): Georgoulas, G. ; Kappatos, V. ; Stylios, C. ; Dermatas, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Thessaloniki, Greece, Greece
Conference Date: 24 June 2009
Page(s): 1,540 - 1,545
ISBN (CD): 978-1-4244-4685-8
ISBN (Paper): 978-1-4244-4684-1
DOI: 10.1109/MED.2009.5164766
Regular:

In this research work we investigate the analysis of Acoustic Emission (AE) signals using wavelet decomposition to locate a single event (crack), which usually takes place in three typical areas... View More

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