IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation on the choice of the initial temperature in the Simulated Annealing: A mushy state SA for TSP

2009 17th Mediterranean Conference on Control and Automation (MED)

Author(s): Shakouri G, H. ; Shojaee, K. ; Behnam T, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: Thessaloniki, Greece, Greece
Conference Date: 24 June 2009
Page(s): 1,050 - 1,055
ISBN (CD): 978-1-4244-4685-8
ISBN (Paper): 978-1-4244-4684-1
DOI: 10.1109/MED.2009.5164685
Regular:

It is a long time that the Simulated Annealing (SA) procedure is introduced as a non-derivative based optimization for solving NP-hard problems. Improvements from the original algorithm in the... View More

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