IEEE - Institute of Electrical and Electronics Engineers, Inc. - In-situ measurement of electromagnetic properties of material using multi-conductor TEM transmission line

2009 IEEE Antennas and Propagation Society International Symposium (APSURSI)

Author(s): Hyoung-sun Youn ; Iskander, M. ; Evanss, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: North Charleston, SC, USA, USA
Conference Date: 1 June 2009
Page(s): 1 - 4
ISBN (Paper): 978-1-4244-3647-7
ISSN (Paper): 1522-3965
DOI: 10.1109/APS.2009.5172387
Regular:

A novel in-situ probe for measuring both ε*and μ* over a broad frequency band has been developed. The probe design is based on two sections of multi-conductor TEM transmission line. The... View More

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