IEEE - Institute of Electrical and Electronics Engineers, Inc. - A PO-MoM comparison for electrically large dielectric geometries

2009 IEEE Antennas and Propagation Society International Symposium (APSURSI)

Author(s): Meana, J.G. ; Martinez-Lorenzo, J.A. ; Rappaport, C. ; Las-Heras, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: North Charleston, SC, USA, USA
Conference Date: 1 June 2009
Page(s): 1 - 4
ISBN (Paper): 978-1-4244-3647-7
ISSN (Paper): 1522-3965
DOI: 10.1109/APS.2009.5172142
Regular:

This paper presents a comparison between PO and full wave RCS results for dielectric scattering geometries. The dihedral example shows good agreement when computing reflections, with the second... View More

Advertisement