IEEE - Institute of Electrical and Electronics Engineers, Inc. - A measurement method for verifying impedance match condition of assembled RFID tag

2009 IEEE Antennas and Propagation Society International Symposium (APSURSI)

Author(s): Sung-Lin Chen ; Ken-Huang Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: North Charleston, SC, USA, USA
Conference Date: 1 June 2009
Page(s): 1 - 4
ISBN (Paper): 978-1-4244-3647-7
ISSN (Paper): 1522-3965
DOI: 10.1109/APS.2009.5172096
Regular:

A measurement method for verifying final conjugate match condition of assembled RFID tag is proposed in this paper. The verification results and maximum read range test results are all in good... View More

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