IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulated Surface Enhanced Raman Spectroscopy via scattering on a dense, randomly-oriented, array of nanostructures

2009 IEEE Antennas and Propagation Society International Symposium (APSURSI)

Author(s): Baczewski, A.D. ; Shanker, B. ; Kempel, L.C. ; Hogan, T.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: North Charleston, SC, USA, USA
Conference Date: 1 June 2009
Page(s): 1 - 4
ISBN (Paper): 978-1-4244-3647-7
ISSN (Paper): 1522-3965
DOI: 10.1109/APS.2009.5171941
Regular:

As a verification of our Monte Carlo algorithm, we have validated our results against the results presented in [3], for scattering on a distribution of ellipsoidal scatterers in free space. As a... View More

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