IEEE - Institute of Electrical and Electronics Engineers, Inc. - Integration of linear sampling and Newton-like schemes in inverse scattering

2009 IEEE Antennas and Propagation Society International Symposium (APSURSI)

Author(s): Bozza, G. ; Brignone, M. ; Pastorino, M. ; Piana, M. ; Randazzo, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: North Charleston, SC, USA, USA
Conference Date: 1 June 2009
Page(s): 1 - 4
ISBN (Paper): 978-1-4244-3647-7
ISSN (Paper): 1522-3965
DOI: 10.1109/APS.2009.5171684
Regular:

Nowadays microwave imaging finds application in several fields, including civil engineering, non-destructive testing and evaluations (NDT/NDE) and medical imaging [1-3]. In this contribution a new... View More

Advertisement