IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quantifying Artifacts of Virtualization: A Framework for Mirco-Benchmarks

2009 International Conference on Advanced Information Networking and Applications Workshops (WAINA)

Author(s): Matthews, C. ; Coady, Y. ; Neville, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Bradford, United Kingdom, United Kingdom
Conference Date: 26 May 2009
Page(s): 1,079 - 1,084
ISBN (CD): 978-0-7695-3639-2
ISBN (Paper): 978-1-4244-3999-7
DOI: 10.1109/WAINA.2009.118
Regular:

One of the novel benefits of virtualization is its ability to emulate many hosts with a single physical machine. This approach is often used to support at-scale testing for large-scale distributed... View More

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