IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling approaches for nanomanufacturing risk assessment

2009 IEEE International Symposium on Sustainable Systems and Technology (ISSST)

Author(s): Ok, Z.D. ; Benneyan, J.C. ; Isaacs, J.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Tempe, AZ, USA, USA
Conference Date: 18 May 2009
Page(s): 1
ISBN (Paper): 978-1-4244-4324-6
DOI: 10.1109/ISSST.2009.5156711
Regular:

ALTHOUGH nanotechnology holds enormous promise in energy, technology, medicine, electronics, consumer products, and other applications, significant uncertainty exists regarding associated... View More

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