IEEE - Institute of Electrical and Electronics Engineers, Inc. - Built-in self-repair techniques for content addressable memories

2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

Author(s): Guan-Quan Lin ; Zhen-Yu Wang ; Shyue-Kung Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Hsinchu, Taiwan, Taiwan
Conference Date: 28 April 2009
Page(s): 267 - 270
ISBN (CD): 978-1-4244-2782-6
ISBN (Paper): 978-1-4244-2781-9
DOI: 10.1109/VDAT.2009.5158146
Regular:

In this paper, we propose block-level replacement techniques for content-addressable memories. The CAM array is first divided into row banks and column banks. Then, for each divided array (the... View More

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