IEEE - Institute of Electrical and Electronics Engineers, Inc. - iScan: Indirect-access scan test over HOY test platform

2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

Author(s): Chao-Wen Tzeng ; Chun-Yen Lin ; Shi-Yu Huang ; Chih-Tsun Huang ; Jing-Jia Liou ; Hsi-Pin Ma ; Po-Chiun Huang ; Cheng-Wen Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Hsinchu, Taiwan, Taiwan
Conference Date: 28 April 2009
Page(s): 60 - 63
ISBN (CD): 978-1-4244-2782-6
ISBN (Paper): 978-1-4244-2781-9
DOI: 10.1109/VDAT.2009.5158095
Regular:

In this paper, we introduce a new test paradigm called indirect-access scan test, demonstrated over the HOY test platform [12]. Unlike the traditional ATE-based testing, the test data in this... View More

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