IEEE - Institute of Electrical and Electronics Engineers, Inc. - From living faster to living better

2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

Author(s): de Vries, R.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Hsinchu, Taiwan, Taiwan
Conference Date: 28 April 2009
Page(s): 2 - 3
ISBN (CD): 978-1-4244-2782-6
ISBN (Paper): 978-1-4244-2781-9
DOI: 10.1109/VDAT.2009.5158080
Regular:

For decades semiconductor developments have been driven by Moore's Law productivity gains. This led to extremely fast digital processors, increase in bandwidth and huge memories that boost... View More

Advertisement