IEEE - Institute of Electrical and Electronics Engineers, Inc. - Maintaining Accuracy of Test Compaction through Adaptive Re-learning

2009 27th IEEE VLSI Test Symposium (VTS)

Author(s): Biswas, S. ; Blanton, R.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Santa Cruz, CA, USA, USA
Conference Date: 3 May 2009
Page(s): 257 - 263
ISBN (Paper): 978-0-7695-3598-2
ISSN (Paper): 1093-0167
DOI: 10.1109/VTS.2009.59
Regular:

In test compaction, the objective is to reduce cost of testing an integrated system by applying a subset of its specification-based tests. One approach for accomplishing this objective is to... View More

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