IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing for Transistor Aging

2009 27th IEEE VLSI Test Symposium (VTS)

Author(s): Baba, A.H. ; Mitra, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Santa Cruz, CA, USA, USA
Conference Date: 3 May 2009
Page(s): 215 - 220
ISBN (Paper): 978-0-7695-3598-2
ISSN (Paper): 1093-0167
DOI: 10.1109/VTS.2009.56
Regular:

Transistor aging results in circuit delay degradation over time,and is a growing concern for future systems. On-line circuit failure prediction, together with on-line self-test, can overcome... View More

Advertisement