IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated Debug of Speed Path Failures Using Functional Tests

2009 27th IEEE VLSI Test Symposium (VTS)

Author(s): McLaughlin, R. ; Venkataraman, S. ; Lim, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Santa Cruz, CA, USA, USA
Conference Date: 3 May 2009
Page(s): 91 - 96
ISBN (Paper): 978-0-7695-3598-2
ISSN (Paper): 1093-0167
DOI: 10.1109/VTS.2009.53
Regular:

Debug of at-speed failures using functional tests is a key challenge as part of frequency pushes during post-silicon debug to improve performance of high performance designs, especially... View More

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