IEEE - Institute of Electrical and Electronics Engineers, Inc. - Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller

2009 27th IEEE VLSI Test Symposium (VTS)

Author(s): Maniatakos, M. ; Karimi, N. ; Tirumurti, C. ; Jas, A. ; Makris, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Santa Cruz, CA, USA, USA
Conference Date: 3 May 2009
Page(s): 9 - 14
ISBN (Paper): 978-0-7695-3598-2
ISSN (Paper): 1093-0167
DOI: 10.1109/VTS.2009.32
Regular:

We discuss the results of an extensive fault simulation study involving the control logic of a modern Alpha-like microprocessor. In this comparative study, faults are injected in both the RT- and... View More

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