IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient Array Characterization in the UltraSPARC T2

2009 27th IEEE VLSI Test Symposium (VTS)

Author(s): Ziaja, T. ; Tan, P.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Santa Cruz, CA, USA, USA
Conference Date: 3 May 2009
Page(s): 3 - 8
ISBN (Paper): 978-0-7695-3598-2
ISSN (Paper): 1093-0167
DOI: 10.1109/VTS.2009.58
Regular:

Arrays constitute increasingly more area in microprocessor designs. Identifying failing cells in these arrays is essential for process characterization and to regain yield by replacing failing... View More

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