IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance and Reliability of Si-Nanocrystal Double Layer Memory Devices with High-k Control Dielectrics

2009 IEEE International Memory Workshop (IMW)

Author(s): Gay, G. ; Molas, G. ; Bocquet, M. ; Jalaguier, E. ; Gely, M. ; Masarotto, L. ; Colonna, J.P. ; Grampeix, H. ; Martin, F. ; Brianceau, P. ; Vidal, V. ; Kies, R. ; Yckache, K. ; De Salvo, B. ; Ghibaudo, G. ; Baron, T. ; Bongiorno, C. ; Lombardo, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Monterey, CA, USA, USA
Conference Date: 10 May 2009
Page(s): 1 - 4
ISBN (Paper): 978-1-4244-3762-7
DOI: 10.1109/IMW.2009.5090603
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