IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic detection of defective shadow mask holes using the periodicity

2009 4th IEEE Conference on Industrial Electronics and Applications (ICIEA)

Author(s): Dong-Min Woo ; Dong-Chul Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Xian, China, China
Conference Date: 25 May 2009
Page(s): 3,615 - 3,618
ISBN (CD): 978-1-4244-2800-7
ISBN (Paper): 978-1-4244-2799-4
DOI: 10.1109/ICIEA.2009.5138880
Regular:

With the production of high resolution TFT-LCD display, the visual inspection of its shadow mask is very important to its production process for the quality assurance. Since the size of LCD... View More

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