IEEE - Institute of Electrical and Electronics Engineers, Inc. - System reliability estimation and confidence regions from subsystem and full system tests

2009 American Control Conference (ACC-09)

Author(s): J.C. Spall
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: St. Louis, MO, USA
Conference Date: 10 June 2009
Page(s): 5,067 - 5,072
ISBN (CD): 978-1-4244-4524-0
ISBN (Paper): 978-1-4244-4523-3
ISSN (Electronic): 2378-5861
ISSN (Uncategorized ISSN): 0743-1619
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2009.5160460
Regular:

This paper develops a rigorous and practical method for estimating the reliability-with confidence regions-of a complex system based on a combination of full system and subsystem (and/or component... View More

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