IEEE - Institute of Electrical and Electronics Engineers, Inc. - MTL robust testing and verification for LPV systems

2009 American Control Conference (ACC-09)

Author(s): G.E. Fainekos ; G.J. Pappas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2009
Conference Location: St. Louis, MO, USA
Conference Date: 10 June 2009
Page(s): 3,748 - 3,753
ISBN (CD): 978-1-4244-4524-0
ISBN (Paper): 978-1-4244-4523-3
ISSN (Electronic): 2378-5861
ISSN (Uncategorized ISSN): 0743-1619
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2009.5159969
Regular:

This paper deals with the robust metric temporal logic (MTL) testing and verification of linear systems with parametric uncertainties. This is a very general class of systems that includes not... View More

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