IEEE - Institute of Electrical and Electronics Engineers, Inc. - Adaptive design for nanometer technology

2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009

Author(s): S. Das ; D. Blaauw
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Taipei, Taiwan
Conference Date: 24 May 2009
Page(s): 77 - 80
ISBN (CD): 978-1-4244-3828-0
ISBN (Paper): 978-1-4244-3827-3
ISSN (Electronic): 2158-1525
ISSN (Paper): 0271-4302
DOI: 10.1109/ISCAS.2009.5117689
Regular:

Rising design uncertainties at advanced process nodes place conflicting demands on todays engineers. The widening safety-margins required to ensure robust designs in the face of such uncertainties... View More

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