IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fabrication and characterization of emerging nanoscale memory

2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009

Author(s): SangBum Kim ; Yuan Zhang ; Byoungil Lee ; M. Caldwell ; H.-S.P. Wong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Taipei, Taiwan
Conference Date: 24 May 2009
Page(s): 65 - 68
ISBN (CD): 978-1-4244-3828-0
ISBN (Paper): 978-1-4244-3827-3
ISSN (Electronic): 2158-1525
ISSN (Paper): 0271-4302
DOI: 10.1109/ISCAS.2009.5117686
Regular:

Conventional solid state memory technologies such as flash memory, DRAM, and SRAM are facing scaling challenges due to fundamental limitations. Therefore, various new memory technologies are being... View More

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