IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hybrid BiST solution for Analog to Digital Converters with low-cost Automatic Test Equipment compatibility

2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009

Author(s): S. Dasnurkar ; J.A. Abraham
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Taipei, Taiwan
Conference Date: 24 May 2009
Page(s): 9 - 12
ISBN (CD): 978-1-4244-3828-0
ISBN (Paper): 978-1-4244-3827-3
ISSN (Electronic): 2158-1525
ISSN (Paper): 0271-4302
DOI: 10.1109/ISCAS.2009.5117672
Regular:

The cost of testing mixed signal circuitry with conventional analog-stimulus is significantly higher than digital circuitry due to higher cost automatic test equipment (ATE) required for... View More

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