IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physical characterisation of deprivation in cities: How can remote sensing help to profile poverty (slum dwellers) in the megacity of Delhi/India?)

2009 Joint Urban Remote Sensing Event

Author(s): Netzband, M. ; Rahman, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Shanghai, China, China
Conference Date: 20 May 2009
Page(s): 1 - 5
ISBN (CD): 978-1-4244-3461-9
ISBN (Paper): 978-1-4244-3460-2
DOI: 10.1109/URS.2009.5137652
Regular:

Addressing the question 'Is the world urbanizing in a context of poverty?' has been so far based on limited information. There is only poor scientific and operational knowledge of this process.... View More

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